CONTACT US: Contact info
|
Citation |
Johnson DB, Perlin VE, Rohde MM, Thomas AC, Luu CQ, Chang J. J. Forensic Sci. 2013; 58(3): 631-644. |
|
Affiliation |
Quantum Signal LLC, 200 N. Ann Arbor St., Saline, MI, 48176. |
|
Copyright |
(Copyright © 2013, American Society for Testing and Materials, Publisher John Wiley and Sons) |
|
DOI |
|
PMID |
23550901 |
|
Abstract |
It is often challenging to ascribe an objective measure of confidence for identifications based on surveillance imagery from a crime scene. The present work seeks to address this deficiency in the case of garment comparison evidence by developing a quantitative method for establishing a conservative lower bound on the likelihood ratio (LR) for identifications involving patterned garments. The method is based on statistical analysis of pattern offset measurements taken from a sample of garments of the same type (manufacturer, style, and size) as the seized evidence. The developed analysis framework was demonstrated on different types of garments over a range of modeled surveillance imaging scenarios with variable image quality; the lower bounds on the LRs ranged from approximately 10-1 to over 400-1. The statistical model was tested and validated through a large-scale empirical study involving both simulated and human observer-performed garment comparisons. Language: en |