@article{ref1,
title="The weibull stress-life, log-log stress-life, and the overload-stress reliability models in accelerated life testing",
journal="Reliability engineering",
year="1985",
author="Kececioglu, Dimitri and Jacks, Julie A.",
volume="11",
number="2",
pages="109-120",
abstract="This is the second in a series of papers on Accelerated Life Testing by the authors. In this paper, the following three accelerated testing models are covered and their application is illustrated by examples: 1.1. Weibull stress-life;2.2. log-log stress-life; and3.3. overload-stress reliability.These models may be applied to any type of components and equipment.<p />",
language="",
issn="0143-8174",
doi="10.1016/0143-8174(85)90050-2",
url="http://dx.doi.org/10.1016/0143-8174(85)90050-2"
}