@article{ref1,
title="The detection of structural conversions in crystallizing thin films of the Ta-Si system by the method of coherent optical Fourier-analysis",
journal="Defect and Diffusion Forum",
year="2001",
author="Sidorenko, S.I. and Makogon, Yu.N. and Mokhort, V.A. and Dziaryk, A.A. and Zelenin, O.V.",
volume="",
number="194-199 PART 2",
pages="1637-1642",
abstract="<p>[Abstract unavailable]</p><p>Language: en</p>",
language="en",
issn="1012-0386",
doi="10.4028/www.scientific.net/ddf.194-199.1637",
url="http://dx.doi.org/10.4028/www.scientific.net/ddf.194-199.1637"
}