TY  - JOUR
PY  - 1985//
TI  - The weibull stress-life, log-log stress-life, and the overload-stress reliability models in accelerated life testing
JO  - Reliability engineering
A1  - Kececioglu, Dimitri
A1  - Jacks, Julie A.
SP  - 109
EP  - 120
VL  - 11
IS  - 2
N2  - This is the second in a series of papers on Accelerated Life Testing by the authors. In this paper, the following three accelerated testing models are covered and their application is illustrated by examples: 1. 1. Weibull stress-life; 2. 2. log-log stress-life; and 3. 3. overload-stress reliability.   These models may be applied to any type of components and equipment.<p /> 
LA  - 
SN  - 0143-8174
UR  - http://dx.doi.org/10.1016/0143-8174(85)90050-2
ID  - ref1
ER  -