TY  - JOUR
PY  - 2018//
TI  - Suicide risk, temperament traits, and sleep quality in patients with refractory epilepsy
JO  - Epilepsy and behavior
A1  - Castro, Sayra Catalina Coral
A1  - Baroni, Gislaine Verginia
A1  - Martins, William Alves
A1  - Palmini, André Luis Fernandes
A1  - Bisol, Luísa Weber
SP  - 254
EP  - 258
VL  - 80
IS  - 
N2  - OBJECTIVES: The objective of the study was to access the suicide risk (SR) in patients with refractory epilepsy and its association with temperament and sleep quality. <br><br>METHODS: A total of 50 consecutive patients referred for epilepsy surgery evaluation in the Porto Alegre Epilepsy Surgery Program were included. All patients had a detailed neurologic and psychiatric evaluation, including video-electroencephalogram (VEEG), high-resolution magnetic ressonance imaging (MRI), and neuropsychologic assessment. In addition, structured questionnaires were applied: module C of the MINI-plus (International Neuropsychiatric Interview-Brazilian version 5.0.0), Affective and Emotional Composite Temperament Scale (AFECTS), and Pittsburgh Sleep Quality Index (PSQI). <br><br>RESULTS: Ten patients (20.0%) showed an increased SR. The most frequent location of the epileptic focus was in the temporal lobe (50%; n=25). Final diagnosis on VEEG comprised epilepsy in 74.0% (n=37), psychogenic nonepileptic seizures (PNES) in 8.0% (n=4), and both in 12%. Thirty patients (60.0%) received surgery indication. Mood disorders were the main psychiatric diagnosis, found in 19 subjects (70.4%), with major depressive disorder (MDD) encountered in 15 patients (55.6%). In the group, SR was more frequent in patients with sleep disorders (p=0.001) and elevated scores of high emotional sensitivity (p=0.003). <br><br>CONCLUSION: In this cohort of patients with highly refractory epilepsy, there was a significant association between SR, sleep disorders, and high emotional sensitivity. Careful evaluation of these factors should be performed in these patients to fully access SR.<br><br>Copyright © 2018 Elsevier Inc. All rights reserved.<p />  <p>Language: en</p>
LA  - en
SN  - 1525-5050
UR  - http://dx.doi.org/10.1016/j.yebeh.2018.01.022
ID  - ref1
ER  -