TY  - JOUR
PY  - 1992//
TI  - Soft X-Ray Spectroscopic Analysis of Ni-Silicides
JO  - Journal of the physical society of Japan
A1  - Nakamura, H.
A1  - Hirai, M.
A1  - Kusaka, M.
A1  - Iwami, M.
A1  - Watabe, H.
SP  - 616
EP  - 620
VL  - 61
IS  - 2
N2  - The valence-band electronic structure of Ni-silicide system, NiSi2, NiSi and Ni2Si, has been studied by measuring soft X-ray Si L2,3 emission spectra. It is found that the Si L2,3 spectra show very different spectral features among these three suicides. The spectra of silicides are compared with the theoretical density of states and discussion is given on the electronic structure of these silicides. It is suggested that Si s electronic state contributes significantly to the upper part of valence-band of the three silicide systems. © 1992, THE PHYSICAL SOCIETY OF JAPAN. All rights reserved.<p /> <p>Language: en</p>
LA  - en
SN  - 0031-9015
UR  - http://dx.doi.org/10.1143/JPSJ.61.616
ID  - ref1
ER  -