Citation

Liu Y, Rausand M. J. Loss Prev. Process Ind. 2011; 24(1): 49-56.

Copyright

(Copyright © 2011, Elsevier Publishing)

DOI

10.1016/j.jlp.2010.08.014

PMID

unavailable

Abstract

Safety instrumented systems (SISs) are commonly used in the process industry, to respond to hazardous events. In line with the important standard IEC 61508, SISs are generally classified into two types: low-demand systems and high-demand systems. This article explores this classification by studying the SIS reliability for varying demand rates, demand durations, and test intervals. The approach is based on Markov models and is exemplified by two simple system configurations. The SIS reliability is quantified by the probability of failure on demand (PFD) and the frequency of entering a hazardous state that will lead to an accident if the situation is not controlled by additional barriers. The article concludes that very low-demand systems are similar and may be treated as a group. The same applies to very high-demand system. Between these group, there is a rather long interval where the demand rate is neither high-demand nor low-demand. These medium-demand systems need a specific treatment. The article shows that the frequency of entering into a hazardous state increases with the demand rate for low-demand systems, while it is nearly independent of both the demand rate and the demand duration for high-demand systems. The PFD is an adequate measure for the SIS reliability for low-demand systems, but may be confusing and difficult to interpret for high-demand systems.

Language: en