Citation

Nakamura H, Hirai M, Kusaka M, Iwami M, Watabe H. J. Phys. Soc. Jpn. 1992; 61(2): 616-620.

Copyright

(Copyright © 1992, Physical Society of Japan)

DOI

10.1143/JPSJ.61.616

PMID

unavailable

Abstract

The valence-band electronic structure of Ni-silicide system, NiSi2, NiSi and Ni2Si, has been studied by measuring soft X-ray Si L2,3 emission spectra. It is found that the Si L2,3 spectra show very different spectral features among these three suicides. The spectra of silicides are compared with the theoretical density of states and discussion is given on the electronic structure of these silicides. It is suggested that Si s electronic state contributes significantly to the upper part of valence-band of the three silicide systems. © 1992, THE PHYSICAL SOCIETY OF JAPAN. All rights reserved.

Language: en

Keywords

experiment; Ni-silicide; Si s density of state; soft X-ray emission spectroscopy; valence band electronic structure