Citation

Park JR, Lim DW, Lee SY, Lee HW, Choi MH, Chung SC. Int. J. Neurosci. 2008; 118(6): 857-865.

Affiliation

Department of Photonic Engineering, Chosun University, Gwangju, South Korea.

Copyright

(Copyright © 2008, Informa - Taylor and Francis Group)

DOI

10.1080/00207450701239459

PMID

18465429

Abstract

This study identifies differences in the electroencephalogram (EEG) responses caused by individual sensitivity to simulator sickness. Simulator sickness was investigated by studying the changes in simulator sickness in two different subject groups (sick group and nonsick group). Subjective evaluations using the simulator sickness questionnaire and the EEG response data were gathered every 5 min while the subjects were driving at 60 km/h for 60 min in the driving graphic simulator. The response to every item of the subjective evaluation increased linearly with time; the response level in the sick group was higher than in the nonsick group. The EEG analysis showed that the sick and nonsick groups were statistically significantly different with respect to the parameter theta/total at frontal lobe and parietal lobe.

Language: en