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Journal Article

Citation

White RM, Keller RR. Forensic Sci. Int. 2015; 249C: 266-270.

Affiliation

National Institute of Standards and Technology, Boulder, CO, USA.

Copyright

(Copyright © 2015, Elsevier Publishing)

DOI

10.1016/j.forsciint.2015.02.003

PMID

25747326

Abstract

Firearm serial numbers are a critical identifying mark, and restoration of destroyed serial numbers is often crucial for prosecution of a criminal case. A method is presented utilizing electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM) which allows for clear visualization of die-stamped imprints which have been completely polished away. Evidence of the stamp can be observed to a depth of approximately 760μm below the surface. With further development, the described method is capable of reconstructing an 8 character serial number in approximately 1h.


Language: en

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