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Journal Article

Citation

Gong J, Liu J, Shangguang L, Zhang Q, Peng Z, Li Z, Chen C, Shi L. Neuropsychologia 2019; ePub(ePub): ePub.

Affiliation

School of Education, Hunan University of Science and Technology, Xiangtan, Hunan, China. Electronic address: shilj@psych.ac.cn.

Copyright

(Copyright © 2019, Elsevier Publishing)

DOI

10.1016/j.neuropsychologia.2019.107215

PMID

31574282

Abstract

Childhood maltreatment (CM) is a factor of risk for psychosis and is associated with alterations in facial emotion processing.Negative symptoms of schizophrenia-spectrum disorders are associated with deficits in facial emotion processing, but research findings on schizotypy are mixed. This study examined the early stage of facial emotion processing in young adults with high levels of negative schizotypy (NS) and explored the impact of childhood maltreatment. On the basis of the Social and Physical Anhedonia subscales of the Chapman Psychosis-Proneness Scales, a total of 74 high-NS and 52 low-NS individuals were recruited to complete the Childhood Trauma Questionnaire and the dot-probe task. The P100 and N170 components of event-related potentials were measured to assess the processing of four facial expressions of emotion. The high-NS group showed significantly reduced P100 amplitudes for all facial expressions. Angry and fearful expressions elicited larger N170 amplitudes than disgusted and happy expressions. Happy expressions elicited shorter N170 latencies than disgusted expressions. Compared to the high-NS group without CM, the high-NS group with CM had a longer latency of P100. Individuals with high NS, compared to individuals with low NS, have impaired fundamental visual processing, but intact processing of facial figurations. Childhood maltreatment may be a factor responsible for the pathological state of the visual pathway in high NS group.

Copyright © 2019. Published by Elsevier Ltd.


Language: en

Keywords

Childhood maltreatment; Event-related potential; Facial emotion processing; N170; Negative schizotypy; P100

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